#147 5V and 3V3 backpower is untested

Aperto
aperto 4 anni fa da Michael Schloh von Bennewitz · 1 commenti

5V and 3V3 backpower is untested

Problem environment

Host devices may be powered by the 5V and 3V3 power circuits. In some cases this power supply method is documented and depends on conditions.

Steps to reproduce

  1. Refer to the schematic
  2. Locate power interfaces
  3. Examine connections to host

Expected result

The power supply method when backpowering connected host devices conforms to best practices and host documented conditions.

Actual result

Backpowering is untested and undocumented.

Workaround

A backpowering configuration (indication and current rating) may be written to the EEPROM data structure to build a appropriate device tree at host boot.

Severity level

This is low priority because project requirements do not state a (back) power strategy.

# 5V and 3V3 backpower is untested ## Problem environment Host devices may be powered by the 5V and 3V3 power circuits. In some cases this power supply method is documented and depends on conditions. ## Steps to reproduce 1. Refer to the schematic 1. Locate power interfaces 1. Examine connections to host ## Expected result The power supply method when backpowering connected host devices conforms to best practices and host documented conditions. ## Actual result Backpowering is untested and undocumented. ## Workaround A backpowering configuration (indication and current rating) may be written to the EEPROM data structure to build a appropriate device tree at host boot. ## Severity level This is **low priority** because project requirements do not state a (back) power strategy.
Michael Schloh von Bennewitz added the
enhancement
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Michael Schloh von Bennewitz added the
derivative
label 4 anni fa
Michael Schloh von Bennewitz aggiunta alle pietre miliari Postproject catchall 4 anni fa
Michael Schloh von Bennewitz 4 anni fa ha commentato
Proprietario

Partially implemented in 55b3621 to support selective (via JP7) testing.

Partially implemented in 55b3621 to support selective (via JP7) testing.
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